- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/02056 - Passive reduction of errors
Patent holdings for IPC class G01B 9/02056
Total number of patents in this class: 60
10-year publication summary
0
|
0
|
0
|
2
|
2
|
3
|
10
|
12
|
21
|
6
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Carl Zeiss SMT GmbH | 2646 |
8 |
Omron Corporation | 6968 |
5 |
ASML Netherlands B.V. | 6816 |
2 |
Alcon, Inc. | 4899 |
2 |
Alfred E. Mann Institute for Biomedical Engineering at the University of Southern California | 50 |
2 |
Avinger, Inc. | 127 |
2 |
Mitutoyo Corporation | 1218 |
2 |
NinePoint Medical, Inc. | 32 |
2 |
Lumentum Technology UK Limited | 72 |
2 |
Apple Inc. | 50209 |
1 |
Canon U.S.A., Inc. | 472 |
1 |
Centre National de La Recherche Scientifique | 9632 |
1 |
Seiko Epson Corporation | 18724 |
1 |
Hitachi, Ltd. | 16452 |
1 |
Applied Materials, Inc. | 16587 |
1 |
Massachusetts Institute of Technology | 9795 |
1 |
The United States of America as represented by the Secretary of the Navy | 2734 |
1 |
Besi Switzerland AG | 24 |
1 |
Cornell University | 3036 |
1 |
The Curators of the University of Missouri | 965 |
1 |
Other owners | 22 |